TEM STUDIES FOR DIGM IN Kr ION IRRADIATED Au-Cu BILAYERS

ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 6 No. 3 September 1996

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Gao Yuzun, Alexander D E*, Rehn L E*

(General Research Institute for Nonferrous Metals, Beijing100088
* Argonne National Laboratory, IL60439, U. S. A.)

Abstract: Cross-section transmission electron microscopy (TEM) was used to study diffusion induced grain boundary migration (DIGM) in Kr ion irradiated and annealed Au-Cu bilayers. Using this technique, in combination with small probe X-ray energy dispersive spectroscopy, DIGM alloyed zones in Au were identified in an irradiated sample.

Key words: grain boundary migration　electron microscopy　Kr ion

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Sponsored by The Nonferrous Metals Society of China (NFSOC)
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