ISSN: 1003-6326
CN: 43-1239/TG
CODEN: TNMCEW

Vol. 24    No. 1    January 2014

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Migration behavior of solidification nuclei in pure Al melt under effect of electric current pulse
Xi-bin LI, Feng-gui LU, Hai-chao CUI, Xin-hua TANG
(School of Materials Science and Engineering, Shanghai Jiao Tong University, Shanghai 200240, China)
Abstract: A mathematical model considering free nuclei was developed to reveal the migration behavior of the free nuclei. Numerical simulation results show that most of the nuclei on the top surface of the melt move downwards and distribute randomly inside the Al melt, which induces more nucleation sites resulting in grain refinement. At the same time, the effect of nuclei size on the nuclei distribution and refinement employing electric current pulse (ECP) was also investigated. The smaller nuclei migrate a short distance with the Al melt at lower speed. But for the larger nuclei, the migration downwards with higher speed benefits the refinement of interior grains of the melt. The research results help to better understand the refinement process and provide a more reasonable explanation of the grain refinement mechanism using ECP.
Key words: electric current pulse; solidification process; grain refinement mechanism; migration behavior; numerical simulation
Superintended by The China Association for Science and Technology (CAST)
Sponsored by The Nonferrous Metals Society of China (NFSOC)
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